会议专题

The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

总文献量: 79篇会议类型: 国际会议会议地点: 北京主办单位: 中科院计算技术研究所会议日期: 2007-10-08

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An Efficient Peak Power Reduction Technique for Scan Testing

Meng-Fan Wu Kai-Shun Hu Jiun-Lang Huang

Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring Multi-Port ATE

Dan Zhao Ronghua Huang Hideo Fujiwara

Diagnostic Test Generation Targeting Equivalence Classes

Irith Pomeranz Sudhakar M. Reddy

Test Generation for Timing-Critical Transition Faults

Xijiang Lin Mark Kassab Janusz Rajski

Test Compression/Decompression Based on JPEG VLC Algorithm

Hideyuki Ichihara Yukinori Setohara Yusuke Nakashima Tomoo Inoue

Testing Comparison Faults of Ternary Content Addressable Memories with Asymmetric Cells

Jin-Fu Li

Improving Circuit Robustness with Cost-Effective Soft-Error-Tolerant Sequential Elements

Mingjing Chen Alex Orailoglu

System Testing using UML Models

Monalisa Sarma Rajib Mall

Symbolic Path Sensitization Analysis and Applications

Jian Kang Sharad C. Seth Shashank K. Mehta

CREA: A Checkpoint Based Reliable Micro-architecture for Superscalar Processors

Shijian Zhang Weiwu Hu

Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan

Gefu Xu Adit D. Singh

An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing

Xiao-Xin FAN Yu HU Laung-Temg (L.-T.) WANG

Low Power Reduced Pin Count Test Methodology

Krishna Chakravadhanula Nitin Parimi Brian Foutz Bing Li Vivek Chickermane

Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults

Shahdad Irajpour Sandeep K. Gupta Melvin A. Breuer

Estimating the Fault Coverage of Functional Test Sequences Without Fault Simulation

Irith Pomeranz Praveen K. Parvathala Srinivas Patil

Fast Bridging Fault Diagnosis using Logic Information

A. Rousset A. Bosio P. Girard C. Landrault S. Pravossoudovitch A. Virazel

An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits

Elham K. Moghaddam Shaahin Hessabi

Current Testable Design of Resistor String DACs

Masaki Hashizume Yutaka Hata Tomomi Nishida Hiroyuki Yotsuyanagi Yukiya Miura

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

Feijun Zheng Kwang-Ting Cheng Xiaolang Yah John Moondanos Ziyad Hanna

Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic

Shaohua Lei Yinhe Han Xiaowei Li