Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan

摘要：

Enhanced scan designs support high coverage TDF testing but with significant overhead. We present a flip-flop selection strategy for partial enhanced scan designs that offers a favorable trade-off between coverage and overhead. Experimental results using commercial ATPG tools show that 60-90％ of the TDF coverage benefits of enhanced scan can be achieved at 10-30％ of the cost.

关键词： Enhanced scan partial transition delay test Launch-on-Shift Launch-on-Capture

作者: Gefu Xu Adit D. Singh

作者单位: Auburn University, AL, USA

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 335-340

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）