Current Testable Design of Resistor String DACs

摘要：

In this paper, a DFT method of resistor string digital-to-analog converters (DACs) is proposed so as to be tested fully by supply current testing. Targeted defects are opens and shorts in the DACs. Testability of a testable designed DAC is examined experimentally. The results show that shorts and opens in a testable designed DAC will be detected with a smaller number of test vectors by supply current testing.

作者: Masaki Hashizume Yutaka Hata Tomomi Nishida Hiroyuki Yotsuyanagi Yukiya Miura

作者单位: Institute of Technology and Science The University of Tokushima Tokushima, 770-8506 JAPAN Faculty of System Design Tokyo Metropolitan University Tokyo JAPAN

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 399-403

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）