Fast Bridging Fault Diagnosis using Logic Information

摘要：

In this paper, we present a diagnosis methodology targeting the whole set of bridging faults leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts only to logic information provided by the tester without requiring a detailed description of the fault models. It is based on an Effect-Cause analysis providing a ranked list of suspects always including the root caus e of the observed error. Experimental results on benchmarks ISCAS89 and ITC99 show the efficiency of the proposed solution in terms of diagnosis resolution and required computational time.

作者: A. Rousset A. Bosio P. Girard C. Landrault S. Pravossoudovitch A. Virazel

作者单位: Laboratoire dInformatique de Robotique et de Microelectronique de Montpellier-Universite Montpellier II/ CNRS 161 rue Ada, 34392, Montpellier Cedex 05, France

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 33-38

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）