An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability
This paper presents a diagnostic test pattern generation (DTPG) framework based upon a Boolean Satisfiability engine. We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of un-differentiable faults. The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy. By exploring dont cares at the primary inputs, the number of required diagnostic patterns can be reduced. Experimental results show that the proposed method achieves a greater diagnosis resolution when combined with existing approaches. Also, fewer diagnostic test patterns are needed.
Feijun Zheng Kwang-Ting Cheng Xiaolang Yah John Moondanos Ziyad Hanna
Institute of VLSI Design, Zhejiang University, Hangzhou, China Department of Electrical and Computer Department of Electrical and Computer Engineering, University of California at Santa Barbara, Institute of VLSI Design, Zhejiang University, Hangzhou, China Intel Corporation
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
288-294
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）