Testing Comparison Faults of Ternary Content Addressable Memories with Asymmetric Cells
Abstract-Ternary content addressable memory (TCAM) is one key component in the dedicated hardware modulars for high-performance networking applications. Symmetric and asymmetric cells are two widely used cell structures in TCAMs. An asymmetric cell consists of a binary content addressable memory (BCAM) bit and a mask bit. This paper proposes two march-like test algorithms, THit and TPAE, to cover the comparison faults of the BCAM cell and the comparison logic faults of the masking cell. THit requires 7N Write operations and (3N+2B) Compare operations to cover the comparison faults of an N×B-bit TCAM with Hit output only. TPAE requires 4N Write operations and (3N+2B) Compare operations to cover the comparison faults of an N×B-bit TCAM with priority address encoder (PAE) output.
Jin-Fu Li
Advanced Reliable Systems (ARES) Laboratory Department of Electrical Engineering National Central University Jhongli, Taiwan, 320
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
495-500
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）