Test Generation for Timing-Critical Transition Faults

摘要：

Timing-aware ATPG 1 has been shown to be aneffective method for generating high-quality test sets thatdetect small delay defects through the longest paths.However, this method usually results in a much higher testpattern count than the traditional transition fault testgeneration. In this paper, we propose a new criterion thatidentifies a subset of transition faults to be targeted by the timing-aware ATPG in order to reduce test pattern countwhile minimizing the impact on the overall delay testquality. The new criterion utilizes the minimal static slack to classify certain transition faults as timing-critical. Thetest pattern count reduction is achieved by restricting thetiming-aware ATPG to targeting the timing-critical transition faults while using traditional transition fault testgeneration for the remaining transition faults. Theexperimental results for the industrial circuits show the effectiveness of the proposed method.

作者: Xijiang Lin Mark Kassab Janusz Rajski

作者单位: Mentor Graphics Corp. 8005 SW Boeckman Rd Wilsonvill, OR 97068

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 487-492

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）