Diagnostic Test Generation Targeting Equivalence Classes

摘要：

We describe a diagnostic test generation procedure that targets the equivalence classes of the test set as it is being generated, instead of considering one fault pair at a time (an equivalence class contains faults that are indistinguished by the test set). When an equivalence class is targeted, all the fault pairs in the equivalence class are targeted simultaneously. This reduces the number of test generation targets, and as a result, it reduces the number of tests in the final test set as well as the test generation time. The implementation of the diagnostic test generation procedure is based on a test elimination process that can accommodate equivalence classes of any size.

作者: Irith Pomeranz Sudhakar M. Reddy

作者单位: School of Electrical & Computer Eng. Purdue University W. Lafayette, IN 47907, U. S. A. Electrical & Computer Eng. Dept. University of Iowa lowa City. IA 52242. U. S. A.

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 301-304

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）