总文献量: 28篇会议类型: 国际会议会议地点: 上海主办单位: IEEE会议日期: 2010-12-05
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Transaction Level Formal Verification using Timed Automata
An Approach for Verification Assertions Reuse in RTL Test Pattern Generation
Clock Signal Modulation for IC Electromagnetic Compatibility
An Approach to Test Scheduling for Asynchronous On-Chip Interconnects Using Integer Programming
VPLib: A Hybrid Method to Verify Microprocessor Prototypes on FPGA
Test Wrapper Design for 3D System-on-Chip Using Optimized Number of TSVs
Testable and Built-In Self-Test Techniques for Motion Estimation Computing Arrays
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