Keynote Speech Low-Power Testing for Low-Power Devices

摘要：

Low-power devices are indispensable for modem electronic applications, and numerous hardware/software techniques have been developed for drastically reducing functional power dissipation. However, the testing of such low-power devices has increasingly become a severe challenge, especially in at-speed scan testing where a transition is launched at the output of a flip-flop and the corresponding circuit response is captured by a flip-flop with a functional clock pulse. The reason is that most or all of the functional constraints with respect to circuit operations and clocking are ignored in at-speed scan testing, which may result in test power that is several times higher than functional power.

作者: Xiaoqing Wen

作者单位: Department of Computer Systems and Engineering Kyushu Institute of Technology Iizuka, Fukuoka 820-8502, Japan

会议类型: 国际会议

会议名称: IEEE 11th Workshop on RTL and High Level Testing(第11届IEEE寄存器传输级与高层次测试国际研讨会 WRTLT10)

会议地点: 上海

会议语种:英文

页码: 3-4

在线出版日期: 2010-12-05（万方平台首次上网日期，不代表论文的发表时间）