A Simulation-Based Feature Selection Approach for Test Point Selection in HDL Models

摘要：

Test and testability are essential concerns in the process of digital design. To decrease the test cost, it is important to have efficient solutions for design for test techniques. Determining an optimal set of test points to be inserted into the design under test has been always a challenge for test designers. In this work utilizing feature selection algorithm, a novel simulation-based approach for test point selection in combinational and scan-based sequential circuits has been proposed. The method is implemented and performed in a HDL environment and the significant improvements over other methods are reported.

关键词： Test Point Insertion Feature Sdection Variable Selection Hardware Description Languages.

作者: Nastaran Nemati Seyyed Ehsan Mahmoudi Amirhossein Simjour Zainalabedin Navabi

作者单位: Electrical and Computer Engineering School of Engineering Colleges - Campus ＃2-University of Tehran, Electrical and Computer Engineering School of Engineering Colleges - Campus ＃2 - University of Tehra

会议类型: 国际会议

会议名称: IEEE 11th Workshop on RTL and High Level Testing(第11届IEEE寄存器传输级与高层次测试国际研讨会 WRTLT10)

会议地点: 上海

会议语种:英文

页码: 21-26

在线出版日期: 2010-12-05（万方平台首次上网日期，不代表论文的发表时间）