X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme

摘要：

X-filling, which assigns logic values to X-bits in a test cube, is widely used to achieve test compression power reduction during testing improvement of test quality in addition to fault detection X-identification can identify many X-bits even in highly compacted tests without degrading the fault coverage of the initial tests. Previous Xidentification techniques were applicable for stuck-at fault tests transition fault tests with launch-off-capture scheme. In this work we propose a method to identify X-bits in transition delay fault tests for launch-off-shift scheme. In experimental results for larger ITC99 benchmark circuits including the largest one (b19: 150K gates), the proposed method identifies almost 80％ of X-bits on the average.

关键词： transition delay fault launch-off-shift ATPG X-bit X-identification X-filling

作者: K. Miyase F.Wu L.Dilillo A.Bosio P.Girard X.Wen S.Kajihara

作者单位: Department of Computer Sciences and Electronics Kyushu Institute of Techonlogy Iizuka.Japan JST CRES Departement Microelectronique LIRMM-University of Montpellier 2 Montpellier,France Department of Computer Sciences and Electronics Kyushu Institute of Techonlogy Iizuka,Japan JST CRES

会议类型: 国际会议

会议名称: IEEE 11th Workshop on RTL and High Level Testing(第11届IEEE寄存器传输级与高层次测试国际研讨会 WRTLT10)

会议地点: 上海

会议语种:英文

页码: 125-129

在线出版日期: 2010-12-05（万方平台首次上网日期，不代表论文的发表时间）