Functional Fault Model for Micro Operation Faults of High Correlation with Stuck-At Faults

摘要：

Several functional fault models have been introduced and few of them have been shown to have high correlation with stuck-at fault model through experiment However, not all the stuck-at faults are considered in the experiment One of the fault categories which were out of consideration is stuck-at faults in the arithmeOc modules. This is because there is no functional fault model correlating well with stuck-at faults in the arithmetic modules. In this work we refine the functional fault model for arithmetic operations and show the superionty of our extended functional ault model to other functional fault model theoretically and experimentally.

关键词： functional fauk model fault coverage arithmetic operations.

作者: Chia Yee OOI Hideo FUJIWARA

作者单位: Microelectronics and Computer Engineering Department Universiti Teknologi Malaysia 81310 UTM Skudai, Nara Institute of Science and Technology 8916-5Takayama lkoma Nara 630-0192,Japan

会议类型: 国际会议

会议名称: IEEE 11th Workshop on RTL and High Level Testing(第11届IEEE寄存器传输级与高层次测试国际研讨会 WRTLT10)

会议地点: 上海

会议语种:英文

页码: 139-144

在线出版日期: 2010-12-05（万方平台首次上网日期，不代表论文的发表时间）