A Scalable Test Access Mechanism for Godson-T Multi-core Processor

摘要：

This paper describes the challenges and features of the Test Access Mechanism (TAM) of Godson-T multi-core processor, wbich contains 16 identical cores. We propose the modular design methodology and configurable test architectUR to achieve good scalability and short time-for implementation, as well as high test coverage and good diagnosability. The TAM not only offers the compression capability with its scalable broadcast structure of sharing inputs and outputs, but also keeps failure data collection time of scan testing constant under variable core yield. Furtbermore, this paper presents the structure of the wrapper boundary cell, which enables the core under test to be completely isolated from its surrounding logic and supports modular test to reduce the test data volume and test power. Since the test stimuli are accessed in parallel and directly delivered into the core under test, we develop a tool to easily map patterns from core level to chip level so that the time of pattern generation is significantly reduced.

关键词： TAM scalability multi-core processor wrapper test pattern generation.

作者: LuningKong Yu Hu XiaoweiLj

作者单位: Key Laboratory of Computer System and Architecture,Institute of Computing Technology,Chinese Academy Key Laboratory of Computer System and Architecture,Institute of Computing Technology,Chinese Academy

会议类型: 国际会议

会议名称: IEEE 11th Workshop on RTL and High Level Testing(第11届IEEE寄存器传输级与高层次测试国际研讨会 WRTLT10)

会议地点: 上海

会议语种:英文

页码: 147-152

在线出版日期: 2010-12-05（万方平台首次上网日期，不代表论文的发表时间）