Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
(0) Launch-off-Shift (LOS) is a widely used technique for delay test in scan-based design. Test data compression for LOS patterns, however, is less efficient. In this paper, we first analyze the reason for low compression rate in LOS patterns, and present an LOS test enabled scan architecture that supports three operation modes: broadcast, multicast, and serial. Efficient LOS test data compression can be achieved under this architecture with limited hardware overhead An ATPG method for LOS test patterns under the proposed architecture is also presented Experimental results show that most of the serial scan operations can be replaced by multicast operations, and thus achieve much better compression rate.
Sying-Jyan Wang Po-Chang Tsai Hung-Ming Weng Katherine Shu-Min Li
Department of Computer Science, National Chung Hsing University, Taichung, Taiwan Department of Computer Science and Engineering, National Sun Yat-Sen University, Taiwan
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
95-98
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）