Resistive Bridging Faults DFT with Adaptive Power Management Awareness

摘要：

A key design constraint of circuits used in handheld devices is the power consumption, due mainly to the limitations of battery life. The employment of adaptive power management (APM) methods optimizes the power consumption of such circuits. This paper describes an effective APM-aware DFT technique that consists of a Test Generation Suite, including fault list generation, test pattern generation and fault simulation. The test generation suite is capable of generating test patterns for multiple supply voltage (Vdd) settings to maximize coverage of resistive bridging faults; and a method to reduce the number of Vdd settings without compromising the fault coverage in order to reduce the cost of test. Preliminarily validations of the proposed DFT technique using a number of benchmark circuits demonstrate its effectiveness.

关键词： Multi-Vdd Test Generation Resistive Bridging Fault Test Point Insertion

作者: Urban Ingelsson Paul Rosinger S. Saqib Khursheed Bashir M. A1-Hashimi Peter Harrod

作者单位: School of Electronics and Computer Science University of Southampton, UK ARM Limited, Cambridge UK

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 101-106

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）