Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources
At the present time, coordinated EDA tools for RF/mixed-signal pin test do not exist. In this paper, a CAD tool for efficient production testing of highperformance RF systems using low-cost baseband ATE is presented. The CAD tool consists of a custom developed genetic ATPG for spectral (Fourier spectrum) signature-based alternate (to full specification-based tests) test of RF systems and involves co-simulation of scalable behavioral-level models of the RF System-Under-Test, baseband ATE test instrumentation, loadboard resources, and DfT resources for fast test vector optimization/generation. The CAD tool also enables the evaluation of various low-cost ATE architectures on the impact of the generated tests to provide a cost-effective solution.
G. Srinivasan A. Chatterjee V. Natarajan
Texas Instruments Inc. Georgia Institute of Technology
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
139-142
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）