A BIST Technique for RF Voltage-Controlled Oscillators
A built-in self-test (BIST) architecture is proposed for voltage-controlled oscillators (VCO) operating at multi gigahertz frequencies. By utilizing a frequency divider and a frequency-to-voltage converter (FVC), the output frequency and tuning range of the VCO can be extracted without external test instruments. The proposed BIST module is integrated with a wideband VCO as the DUT in a 0.18μm CMOS process for demonstration. Within the tuning range of the VCO from 4.4 to 5.5 GHz, a frequency extraction error less than ±0.4％ is achieved. The active area and the power consumption of the BIST module are 0.038mm2 and 11mW, respectively.
Hsieh-Hung Hsieh Yen-Chih Huang Liang-Hung Lu Guo-Wei Huang
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, R. O. C. National Nano Device Laboratories, Hsinchu, R. O. C.
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
143-146
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）