会议专题

An Improved Test Case Generation Method of Pair-Wise Testing

Pair-wise testing is a testing criterion based on specification which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented

software testing pair-wise generation testing criterion 2-dimension table software models

Qian Feng-an Jiang Jian-hui

Key Laboratory of Embedded Systems and Service Computing, Ministry of Education of the Peoples Republic of China, Tongji University, Shanghai 201804, China Department of Computer Science and Technology, Tongji University, Shanghai 201804, China

国际会议

The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

北京

英文

149-154

2007-10-08(万方平台首次上网日期,不代表论文的发表时间)