Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods
Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input steps, the NIST method is shown to be more accurate in predicting the output gain responses than the wavelet transform method.
Xinsong Zhang Simon S. Ang Chandra Carter
University of Arkansas, Fayetteville, Arkansas, 72701 USA Texas Instruments Inc., Dallas, Texas, 75243 USA
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
230-235
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）