Test Generation for Crosstalk Glitches Considering Multiple Coupling Effects
As the feature size continues to scale into the nanometer era, crosstalk-induced effect begins to exert a more significant influence. In this paper, we address the condition of maximum crosstalk glitch noise considering multiple coupling effects and propose a novel test generation technique for this problem. A multiple crosstalk-induced glitch fault (MCGF) model is introduced, which gives information on one or more sub-paths to be sensitized to generate transitions coupled to a victim line. The test for an MCGF is a 2-vector pattern that sensitizes the transition signal along the sub-path to each aggressor line at the maximum aggressive time (MAT), and propagates the signal on a victim line to an output. A new structure, transition map (TM), is proposed to record all the possible arrival time of a line. The MAT of a victim line is calculated based on effective coupling capacitance (ECC). Therefore, the crosstalk-induced effects can be effectively identified, and exactly activated using the generated test patterns. Experiments on ISCAS89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time.
Minjin Zhang Xiaowei Li
Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Acade Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Acade
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
259-264
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）