Fault-dependent/independent Test Generation Methods for State Observable FSMs

摘要：

Since scan testing is not based on the function of the circuit, but rather its structure, this method is considered to be a form of over testing or under testing. It is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical testing and timing testing. This paper proposes two test generation methods, a fault-independent test generation method and a fault-dependent test generation method, for state observable FSMs. We give experimental results for MCNC91 benchmark circuits. The quality and cost of the logic testing and timing testing for proposed test generation methods was evaluated.

关键词： State-observable FSMs Fault-dependent test generation Fault-independent test generation

作者: Toshinori Hosokawa Ryoichi Inoue Hideo Fujiwara

作者单位: College of Industrial Technology, Nihon University 1-2-1, Izumicho, Narashino, Chiba 275-8575, Japan Graduate School of Industrial Technology, Nihon University 1-2-1, Izumicho, Narashino, Chiba 275-857 Graduate School of Information Science, Nara Institute of Science and Technology (NAIST) 8916-5, Tak

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 275-278

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）