Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead

摘要：

Abstract-Effect-cause diagnosis procedures are the most commonly used in industry to diagnose VLSI circuits that fail manufacturing test or field applications. Fast and effective diagnosis procedures are essential to diagnose large numbers of falling dies for yield ramp-up. We have recently proposed a method to speed up effect-cause diagnosis procedures

作者: Huaxing Tang Chen Liu Wu-Tung Cheng Sudahkar M. Reddy Wei Zou

作者单位: Mentor Graphics Corporation, 8005 S. W. Boeckman Road, Wilsonville, Oregon, USA, 97070 ECE Dept., University of Iowa, Iowa City, Iowa, USA, 52242

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 281-287

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）