CAMEL: An Efficient Fault Simulator with Coupling Fault Simulation Enhancement for CAMs
Content addressable memories (CAMs) are widely used in digital systems. A test algorithm for CAMs must be able to cover the random access memory (RAM) faults and comparison faults. However, CAM circuits are usually customized for different products, so there are no standard tests, i.e., tests should be adapted to a specific design manufactured using specific technology. This paper presents a fault simulator, called CAM Evaluation tooL (CAMEL), for the evaluation of fault coverage of CAM test algorithms. It supports five common functional outputs, i. e., Data I/O, hit, multi-hit, matchout, and priority address for various CAM specifications. Since coupling fault simulation dominates the efficiency of a memory fault simulator, a concept of observability is proposed to simplify the coupling fault behavior. By exploiting the observability, a compression technique is also proposed to speed up the fault simulation and reduce memory usage. CAMEL can support both RAM faults and comparison faults. We have demonstrated the CAMEL using widely-used March tests and CAM tests. Simulation results show that the CAMEL can evaluate the fault coverage of tests accurately and efficiently.
Hsiang-Huang Wu Jin-Fu Li Chi-Feng Wu and Cheng-Wen Wu
Realtek Semiconductor Corp., Hsinchu, Taiwan Department of Electrical Engineering National Central University, Jhongli, Taiwan Department of Electrical Engineering National Tsing Hua University, Hsinchu, Taiwan
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
355-360
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）