An HDL-Based Platform for High Level NoC Switch Testing

摘要：

This paper presents a non-scan method of NoC switch testing. The method requires addition of test mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test mode of an NoC, we have developed a test environment based on high-level switch faults. The test environment applies test packets to the NoC-Under-Test in its test mode and generates an NoC fault dictionary to be used for error detection of an NoC running in the test-mode. Proposed fault models and test strategy will be discussed in this paper.

作者: Mahshid Sedghi Armin Alaghi Elnaz Koopahi Zainalabedin Navabi

作者单位: Department of Electrical and Computer Engineering University of Tehran, Tehran, Iran

会议类型: 国际会议

会议名称: The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

会议地点: 北京

会议语种:英文

页码: 453-458

在线出版日期: 2007-10-08（万方平台首次上网日期，不代表论文的发表时间）