Enhanced Broadside Testing for Improved Transition Fault Coverage
The use of multiple scan chains was shown to improve the coverage of transition faults achieved by skewed- load tests. For broadside tests, the number of scan chains does not affect the transition fault coverage. We describe an enhanced broadside configuration under which increasing the number of scan chains helps increase the fault coverage. In the enhanced configuration, the first flip-flop of a scan chain operates in skewed-load made while the other flip- flops operate in broadside made. This provides flexibility in determining the value of the first flip-flop of every scan chain under the second pattern of a broadside test, thus increasing the transition fault coverage. We also describe a procedure that makes small modifications to a given scan chain configuration in order to improve the transition fault coverage.
Irith Pomeranz Sudhakar M. Reddy
School of Electrical & Computer Eng. Purdue University W. Lafayette, IN 47907, U. S. A. Electrical & Computer Eng. Dept. University of Iowa Iowa City, IA 52242, U. S. A.
国际会议
The 16th Asian Test Symposium(第十六届亚洲测试学术会议)
北京
英文
473-478
2007-10-08（万方平台首次上网日期，不代表论文的发表时间）