会议专题

The Diffusion of Ni into Al Wire at the Interface of Ultrasonic Wire Bond During High Temperature Storage

国际会议

2005 6th International Conference on Electronics Packaging Technology(第六届电子封装国际会议)

深圳

英文

377-381

2005-08-30(万方平台首次上网日期,不代表论文的发表时间)