Novel Silicon-Based Flash Cell Structures for Low Power and High Density Memory Applications (invited)
Plasma Treatment on the Plastic Substrates for Liquid Phase Deposited SiO2 Films for Flexible Electronics Applications
Optimization of Excimer Laser Annealing on Low Temperature Polysilicon for Thin Film Transistor Applications
Experimental Evidence of Short-Channel Electron Mobility degradation caused by Interface Charges located at the Gate-Edge of Triple-Gate FinFETs
Process requirements for continued scaling semiconductor devices - The needs for controlling both number and position of impurity atoms