Temperature Impact on the Lorentzian Noise Induced by Electron Valence Band Tunneling in Partially Depleted SOI nMOSFETs
On the Self-Limiting Hot-Carrier Degradation Mechanism in Ultra-deep Submicrometer Lightly-doped-drain NMOSFETs
Microstructures of Ge-dots/Si multilayered structures fabricated by Ni-induced lateral crystallization