会议专题

A Novel Precision Measuring Algorithms of Frequency Characteristic Based on Curve Fitting

国际会议

IEEE 2005 International Symposium on Microwave,Antenna,Propagation and EMC Technologies for Woreless Communications

北京

英文

53-55

2005-08-05(万方平台首次上网日期,不代表论文的发表时间)