会议专题

Measurement of Noise Figure of Active Microwave Devices and the Extraction of Noise Feature parameters

国际会议

IEEE 2005 International Symposium on Microwave,Antenna,Propagation and EMC Technologies for Woreless Communications

北京

英文

581-585

2005-08-05(万方平台首次上网日期,不代表论文的发表时间)