Study on Defects of Square Capillary X-ray Lenses or Slices

摘要：

　　X-ray imaging method as a non-destructive,in-situ,and effective analytical tool plays an important role in material analysis and application.The Square Capillary X-ray Lenses or Slices(SCXLS)as the key optics in X-ray imaging are being studied and reported more and more.In this work,we presented the main defects of SCXLS in the manufacturing process,and gave the corresponding solutions to these defects,which finally enables SCXLS to better enter imaging application for material analysis.

关键词： X-ray imaging Material analysis Square capillary optics

作者: Peng ZHOU Shuang ZHANG Zhi-guo LIU

作者单位: Key Laboratory of Beam Technology of Ministry of Education,College of Nuclear Science and Technology,Beijing Normal University,Beijing 100875,China;Applied Optics Beijing Key Laboratory,Department of Physics,Beijing Normal University,Beijing 100875,China;Beijing Radiation Center,Beijing 100875,China

会议类型: 国际会议

会议名称: 2019 International Conference on Informatics, Control and Robotics 2019信息学、控制和机器人学国际会议(ICICR2019)

会议地点: 上海

会议语种:英文

页码: 394-398

在线出版日期: 2019-06-16（万方平台首次上网日期，不代表论文的发表时间）