Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters

摘要：

　　This paper describes an automated test system for Analog to Digital Converters(ADC)combining various instruments controlled by LabVIEW,to implement standardbased real-time measurement which accurately characterizes the statistical and dynamic performances.Moreover,the proposed system provides an automated input parameter sweep-function,which realizes the ADC intelligent automation test with different input settings.Virtual Instruments(VIs)were created in system program to control signal generation and data acquisition.The system is not limited to the type or speed of the ADC under test due to its high compatibility and hardware modularity.We describe in detail the hardware arrangement and software programming,as well as the experimental testing of real ADCs,to demonstrate systems performance.

关键词： Analog to Digital Converter Test System Automated Sweep Function LabVIEW

作者: WeiWei Qin Sai-Weng Sin Seng-Pan U Rui Paulo Martins

作者单位: State Key Laboratory of Analog and Mixed-Signal VLSI,University of Macau,Macau,China;Department of E State Key Laboratory of Analog and Mixed-Signal VLSI,University of Macau,Macau,China;Department of E State Key Laboratory of Analog and Mixed-Signal VLSI,University of Macau,Macau,China;Department of E

会议类型: 国际会议

会议名称: 2017 6th International Conference on Advanced Materials and Computer Science (ICAMCS 2017) 2017年第六届先进材料与计算机科学国际会议(ICAMCS 2017)

会议地点: 郑州

会议语种:英文

页码: 1-8

在线出版日期: 2017-04-29（万方平台首次上网日期，不代表论文的发表时间）