Influence of the Charge Transfer on the Lifetime of Quantum-Dot Light-Emitting Diodes
The operating lifetime of quantum-dot light-emitting diodes(QLEDs)is a critical parameter for quantum-dot display which is becoming an emerging display technology.To pinpoint the causes of device degradation,we demonstrated an enhanced reliability of all-solution processed QLEDs by introducing an insulating interfacial layer between the ETL and the QDs.It is confirmed that a PMMA interfacial layer can delay the electron transfer and reduce the nonradiative recombination,which in turn slow down the degradation of QDs-ZnO layer.In comparison with the standard QLEDs,device fabricated with PMMA of 1.0 mg/ml shows longest lifetime of 28.7h,which improves the lifetime by 50%.We studied the effect of electrons transfer on the degradation mechanisms,which lays the foundation for further improvement of the device life.
Quantum-dot QLED Electroluminescence Degradation mechanisms Charge transfer Interfacial layer
Yue Liang Chongyu Shen Junfei Chen Weiye Zheng Zheng Xu Jay Guoxu Liu
Shineon(Beijing)Technology Co.Ltd,3/F,Building＃3,Digital Planet,No.58,5thJinghai Road,BDA,Beijing,Ch Shineon(Beijing)Technology Co.Ltd,3/F,Building＃3,Digital Planet,No.58,5thJinghai Road,BDA,Beijing,Ch Key Laboratory of Luminescence and Optical Information,Ministry of Education,Beijing Jiaotong Univer
国际会议
深圳
英文
374-377
2019-11-25（万方平台首次上网日期，不代表论文的发表时间）