A Comparative Study of the Lifetimes of High-End and Low-Cost Off-Line LED Drivers Under Accelerated Test Conditions

摘要：

　　This work presents a comparative study between a set of high-end,name-brand LED off-line drivers and a second set of low-cost drivers.To determine the lifetime of the devices in each sample an accelerated lifetime test was used.The degradation of important parameters of the devices during the test,as well as their lifetime,were recorded.A failure analysis reveals two important failure causes: galvanic corrosion and failed metallized film capacitors.Galvanic corrosion is found to be more frequent in the sample of low-cost devices.It is proposed that this is due to lack of proper cleaning of the assembled circuit board.Finally,the question whether the high-end sample has a significantly longer lifetime compared to the low-cost sample is assessed through a proper statistical test.A higher mean lifetime for the high-end sample cannot be confirmed.

作者: F.Keil K.Hofmann

作者单位: Technische Universit(a)t Darmstadt Integrated Electronic Systems Lab,Merckstr.25,Darmstadt,Germany

会议类型: 国际会议

会议名称: 16th China International Forum on Solid State Lighting & 2019 International Forum on Wide Bandgap Semiconductors (第十六届中国国际半导体照明论坛暨2019国际第三代半导体论坛)

会议地点: 深圳

会议语种:英文

页码: 418-422

在线出版日期: 2019-11-25（万方平台首次上网日期，不代表论文的发表时间）