Failure Analysis of Glass Transition Temperature of LED Insulation Layer
With the development of light-emitting diodes(LEDs)technology,the number of LEDs chips in high-power LEDs devices is increasing,and the use of LEDs continues to expand,the reliability has become the key to its widespread use.When the LEDs device fails,the failure analysis of the device can effectively derive the mechanism and condition of the device failure,which has a significant effect on enhancing the reliability of the device.In this paper,by analyzing the instantaneous voltage curve and thermal of the failed device,it can be concluded that when the operating current of the LEDs device is large,due to the poor thermal conductivity of the insulating layer,the insulating layer of the device is in the vitrification transition temperature for a long time.The shape of the insulating layer is easily changed or even burned to cause delamination,resulting in LEDs failure.
Yibin Wang Fang Fang Jing Wu Kaixuan Lin Tingting Xu Weiqing Liang Luqiao Yin
School of Materials Science and Engineering,Shanghai University,Shanghai 200072,China;Key Laboratory Gold Medal Analytical & Testing Group Key Laboratory of Advanced Display and System Applications,Shanghai University,Ministry of Education
国际会议
深圳
英文
434-437
2019-11-25（万方平台首次上网日期，不代表论文的发表时间）