Polished sample preparing and backscattered electron imaging and of fly ash-cement paste

摘要：

　　In recent decades,the technology of backscattered electron imaging and image analysis was applied in more and more study of mixed cement paste because of its special advantages.Test accuracy of this technology is affected by polished sample preparation and image acquisition.In our work,effects of two factors in polished sample preparing and backscattered electron imaging were investigated.The results showed that increasing smoothing pressure could improve the flatness of polished surface and then help to eliminate interference of morphology on grey level distribution of backscattered electron images; increasing accelerating voltage was beneficial to increase gray difference among different phases in backscattered electron images.

作者: Shuxia Feng Yanqi Li

作者单位: School of Architectural Engineering,Shandong Yingcai University,Jinan,China

会议类型: 国际会议

会议名称: 2017 International Symposium on Application of Materials Science and Energy Materials (SAMSE 2017) (2017材料科学应用与能源材料国际研讨会)

会议地点: 上海

会议语种:英文

页码: 1-5

在线出版日期: 2017-12-28（万方平台首次上网日期，不代表论文的发表时间）