VI Curve Test Based On Discrete Excitation Signals

摘要：

　　In-Circuit Test System is an instrument that uses the VI curve test to diagnose circuit faults.Generally,continuous signals such as sine wave,triangle wave and square wave are used as the VI curve test excitation source.There are some problems in the synchronization of the analysis.In this paper,we study a VI curve test based on discrete excitation signal,analyze the problems arising from continuous signal testing,and propose a continuous signal discretization circuit scheme.The feasibility and practicability of this method are proved by Matlab simulation and experiment.

作者: Yong Cao Xinchi Tang Sijie Shao

作者单位: Detection Technology and Automatic Equipment,Army Academy of Armored Forces,100072 Beijing,China Weapon Systems and Utilization Engineering,Army Academy of Armored Forces,100072 Beijing,China

会议类型: 国际会议

会议名称: 2018 2nd International Conference on Electronic Information Technology and Computer Engineering (EITCE 2018)(2018第二届电子信息技术与计算机工程国际会议)(EITCE2018)

会议地点: 上海

会议语种:英文

页码: 1-4

在线出版日期: 2018-10-12（万方平台首次上网日期，不代表论文的发表时间）