会议专题

Micro-Scale Strain Field Measurement of V-Notches by Digital Image Correlation

  The present work focuses on the optical method to measure the full-field deformation at micro-scale near the notch tip of notched specimens.The digital image correlation(DIC)technique combined with optical microscope system is successfully established for this purpose.For micro-scale measurements,a random speckle pattern of paint is created that can be imaged with an optical microscope.Displacements are measured on the surface of polymer samples under uniaxial tension and a surface displacement resolution of 10 μm over a 4×3 mm scale field of view is established.To demonstrate the capabilities of the method,we characterize the deformation fields generated around a blunted V-notch of a polymer specimen under tensile loading.The DIC technique enables measurement of complex deformation fields with micro-scale precision over relatively large areas,making it of particular relevance to fracture analysis of notches or cracks.

digital image correlation strain fields displacement measurement micro scale V-notches

L.Chen J.G.Zhu D.H.Chen

Faculty of Civil Engineering & Mechanics,Jiangsu University,Zhenjiang 212013,China

国际会议

InternationalConference on Structural Fatigue﹠FractureTheory﹠Experimental Technology (FFTE 2018)(结构疲劳与断裂理论和实验技术国际会议)

海口

英文

127-128

2018-01-12(万方平台首次上网日期,不代表论文的发表时间)