The effect of material matching on the stress-induced power degradation for light-redirecting-ribbon-based silicon photovoltaic modules

摘要：

　　Light redirecting ribbons(LRR)have recently been adopted in crystalline silicon modules in PV industry.The introduction of this LRR may bring additional stress at the boundary of the busbar/wafer contact,which may probably lead to higher power loss after aging.The thermal cycle and electroluminescence(EL)test are employed in this work to investigate this stress-induced power degradation for LRR-based crystalline silicon modules.The obtained results demonstrate that with increase in the thickness of the EVA encapsulant or the decrease in the thickness of the LRR,the power degradation induced by stress can be effectively diminished.

作者: X F Gou H Zhuang J Zhu X Y Li

作者单位: Beijing University of Technology,100124,Beijing,China;CECEP Solar Energy Technology(Zhenjiang)Co.Ltd CECEP Solar Energy Technology(Zhenjiang)Co.Ltd,212132,Zhenjiang,China Beijing University of Technology,100124,Beijing,China

会议类型: 国际会议

会议名称: 第二届新型材料与化学工业国际学术会议

会议地点: 三亚

会议语种:英文

页码: 1-7

在线出版日期: 2017-11-18（万方平台首次上网日期，不代表论文的发表时间）