A SET-hardened phase-locked loop

摘要：

　　A single-event-transient-hardened-by-design(SET-HBD)charge pump(CP)is proposed to improve the reliability of the phase-locked loop(PLL)in SMIC 0.18μm CMOS process.And,the SET-HBD PLL is designed by adopting the proposed SET-HBD CP instead of the traditional CP.Simulation results show that the designed SET-HBD PLL,which is compared with the general PLL(GPLL),has better performances including lower perturbation ΔVctrl of the control voltage Vctrl,faster recovery time of the locked PLL and smaller maximum-phase displacement of the feedback clock.

关键词： charge pump phase-locked loop signle-event transient harden-by-design

作者: Qianneng Zhou Chunhai Zhang Jinyi Tan Ling Zhu Liangcai Wang Wei Luo

作者单位: Chongqing Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology,Chongqin School of Electronic Information and Automation,Sichuan University of Science and Engineering,Zigong

会议类型: 国际会议

会议名称: 2017 IEEE 3rd Information Technology and Mechatronics Engineering Conference(ITOEC2017)(2017 IEEE 第3届信息技术与机电一体化工程国际学术会议)

会议地点: 重庆

会议语种:英文

页码: 196-199

在线出版日期: 2017-10-03（万方平台首次上网日期，不代表论文的发表时间）