Statistical Characteristics for the Defect Occurrence of Raw Silk

摘要：

　　In order to add defects to the computer simulation of the raw silk size series, its necessary to find out the statistical characteristics for the defect occurrence of raw silk.Under the newest ISO standard of the electronic test for raw silk, the defects are classified into small slubs, big slubs, thick places and thin places.In this study, the defects for seven lots of raw silk are tested every 1000 meters, each time 12 skeins are tested together, each test is repeated to 14 to 17 times.According to the occurrence law of the defects during the reeling process and the electronic test data, the research respectively analyzed the probability distribution of the defects theoretically and experimentally.The results showed that all the defects have a Polya distribution, and have a weak spreading characteristic.

关键词： defect occurrence polya distribution fit test raw silk

作者: Jian-mei Xu Ying Zhou Jiantao Niu Dongping Wu

作者单位: College of Textile and Clothing Engineering, Soochow Univ., Suzhou, Jiangsu, 215021, China;National Zhejiang Silk Science & Technology Co.Ltd., Hangzhou, Zhejiang 310011, China

会议类型: 国际会议

会议名称: The 9th China International Silk Conference (ISC2016)(第九届中国国际丝绸会议)

会议地点: 广西宜州

会议语种:英文

页码: 545-552

在线出版日期: 2016-09-09（万方平台首次上网日期，不代表论文的发表时间）