Re-optimization Algorithm for Wrapper Scan Chains Balance Based on Twice-assigned Method Using Dynamic Adjustment and Mean Value
Testing time of System on Chip (SoC) based onintellectual property (IP) has already become the bottleneck forthe development of SoC.A new wrapper scan chain balancealgorithm is proposed to minimize IP-core testing time.Thebalance algorithm is to find the standard-chain through theadjustment value and the mean-chain through the mean value.All the internal scan chains can be divided into two partsaccording to the length of standard-chain L: the scan chain set S≥ within the length no less than L and the remaining part S<.Compute the difference D between S≥ and the mean-chain.In the first assigned process,the scan chain set S≥ regarded asmean-chain are uniformly distributed.Sort the scan chain set S< and the difference D in descending order.In the secondassigned process,assign S< and the positive D to the enableshortest wrapper scan chain and assign the negative D to theenable longest wrapper scan chain successively.Experimentalresults on ITC02 test benchmarks illustrate that the balancealgorithm proposed in this paper is more effective and can getmore balanced results when compared to the existing methods.
SoC test wrapper scan chain Twice-assigned
DENG Libao BIAN Xiaolong JIN Chengyu LIU Yunchao
School of Information and Electrical Engineering Harbin Institute of Technology at Weihai Weihai, Sh Department of Automatic Test and Control Harbin Institute of Technology Harbin, Heilongjiang, China
国际会议
秦皇岛
英文
609-614
2015-09-18（万方平台首次上网日期，不代表论文的发表时间）