Research on the test system for electrical parameters of relay based on STM32
The current test system for electrical parameters of relay, mainly with the 51 series MCU as the central processing unit, peripheral components are various, running speed is limited, and judging the failure of relay only rely on testing the contact resistance exceeds the standard or not, testing parameter is single. Foreign technology on research and development of test system for relays electrical parameters is mature, but the cost is higher. Thus, in this paper, we study a kind of test system for relays electrical parameters with STM32 MCU as the central processing unit, which can realize to test the relays electrical parameters such as coil resistance, contact resistance, suction voltage, release voltage, suction time, release time, arc time and so on. This paper mainly discusses the design principle and hardware structure, finally obtained test data by the experiment, the data show that the test system has the advantages of fast running, stable performance, simple design, and has a certain market value.
STM32 relay electrical parameter test system
Zhen Zhou Zehong Lv Kangkang Guo Li Liang
College of Measure-Control Technology and Communication Engineering Harbin University of Science and Technology Harbin, China
国际会议
秦皇岛
英文
1812-1815
2015-09-18（万方平台首次上网日期，不代表论文的发表时间）