Analysis of Key Interference Sources Affecting CCD Measurement Accuracy

摘要：

　　In actual field test environments,unstable CCD measuring spot center position,the total appears slight shaking,so that measurements and calculated spot position and displacement there is a big error.This paper studies the field environments offline Array CCD measurement technology characteristics,analyzes the key sources of interference affecting the measurement accuracy linear CCD,combined with the test environment deign solutions.

关键词： linear CCD accuracy interference sources stray light

作者: CHEN Donggen XU Jiangtao LIU Hongwei CUI Kaibo

作者单位: Mechanical Engineering College Shijiazhuang,Hebei,China Unit 63981 Wuhan,Hubei,China Unit 63983 Wuxi,Jiangsu,China

会议类型: 国际会议

会议名称: 2016IEEE第二届信息技术、网络、电子及自动化控制会议

会议地点: 重庆

会议语种:英文

页码: 1018-1021

在线出版日期: 2016-03-20（万方平台首次上网日期，不代表论文的发表时间）