A Secondary Circuit Fault Diagnosis Method Based on Probability Statistics in Smart Substation

摘要：

　　In this paper, communication difficulties of the secondary circuit of process level in smart substation are analyzed, modeling for communication components (e.g.:Ethernet switches, IEDs, communication links) are provided,and generation of topological structure of the communication network is introduced.Static transmitting/receiving relations of process level data are concluded by analyzing SCD fides, and the data transmission path is provided by analyzing the topological structure.Finally, the probability of faulty component can be judged by the disconnection alarm messages of the IEDs.The method is reliable and convenient, and faulty component can be located quickly.Therefore, safe operation of secondary circuit is ensured.

关键词： SCD Secondary circuit Smart substation

作者: Liqing Ge Liu Liu Fan Yang Jifeng Wen

作者单位: NR Electric Co., Ltd.,Nanjing, 211102 China

会议类型: 国际会议

会议名称: 第六届现代电力系统自动化和保护国际会议

会议地点: 南京

会议语种:英文

页码: 139-143

在线出版日期: 2015-09-21（万方平台首次上网日期，不代表论文的发表时间）