A Novel Integrated Testing Platform Based on Open VPX
With the development of high-speed and real-time signal processing systems toward modularization,generalization and reconstruction,a method of modular design has been proposed and accepted widely.However,the increasing module types and extending production scale make the module-test challenged and the test results of modules are dispersed,which make it difficult for collection and post-maintenance.Moreover,its difficult to perform traversal test with so many module-combinations,and this consumes excess equipments and human resources.In this paper,we proposed a concept of integrated testing,and designed a integrated testing platform (ITP) based on the Open VPX architecture.The ITP can achieve intelligent identification and resources detection of the under-test single/multiple modules after startup,and with the users manual configurations,the ITP can then perform the traversal test automatically.Besides,the ITP provides functions such as real-time fault alarm and the test report printing.The ITP has been applied in mass testing for an Open VPX-based high-performance processing module,with multiple VLSI (Very Large Scale Integrated) circuits integrated,such as TI TMS320C6678,Xilinx Virtex-6,etc,and greatly increases its efficiency and accuracy.
automatic test traversal test integration testing platform(ITP) signal processing system
Fei Wang Shanqing Hu Xingming Li Jie Wang
Beijing Key Laboratory of Embedded Real-time Information Processing Technology, Beijing Institute of Technology, Beijing, 100081, China
国际会议
重庆
英文
311-318
2016-03-21（万方平台首次上网日期，不代表论文的发表时间）