Loss characterization of Arrayed Waveguide Grating by Fabry-Perot Interferometric Method

摘要：

　　An improved measurement technique for characterizing the on-chip loss of InP-based arrayed waveguide grating is demonstrated.The results match well with that of the conventional test method,but with higher measurement efficiency and less uncertainties.

作者: Songtao Liu Xilin Zhang Dan Lu Ruikang Zhang Wei Wang Chen Ji

作者单位: Key Laboratory of Semiconductor Materials Science,Institute of Semiconductors,CAS,Beijing,China

会议类型: 国际会议

会议名称: 2014 Asia Communications and Photonics Conference(ACP2014)(2014亚洲通信与光子学大会)

会议地点: 上海

会议语种:英文

页码: 1-3

在线出版日期: 2014-11-11（万方平台首次上网日期，不代表论文的发表时间）