Nanoscale Characterization of Structural and Optical Properties of Nitride Nanostructures Using Helium Temperature Scanning Electron Microscopy Cathodoluminescence

摘要：

　　The combination of luminescence spectroscopy-in particular at liquid He temperatures-with the high spatial resolution of a scanning transmission electron microscopy provides a unique,extremely powerful tool for the optical nano-characterization of semiconductors.Typical results which will be presented include nm-scale correlation of the structural and optical properties of different GaN nanorod sample.

作者: Frank Bertram

作者单位: Institute of Experimental Physics,Otto-von-Guericke-University Magdeburg,Universitasts-Platz 2,39106 Magdeburg,Germany

会议类型: 国际会议

会议名称: 2014 Asia Communications and Photonics Conference(ACP2014)(2014亚洲通信与光子学大会)

会议地点: 上海

会议语种:英文

页码: 1-3

在线出版日期: 2014-11-11（万方平台首次上网日期，不代表论文的发表时间）