The Analysis on the Driven Circuit Reliability of the Inverters

摘要：

　　This paper introduces the Failure Mode Effect Analysis method, which is applied in the design of the electric and electronic products.The IGBT driven circuit of the inverts is chosen as an example in order to explain clearly how to use the FMEA method.Using this method, the efficiency of the designers and the reliability of the product can be improved greatly.

关键词： Reliability FMEA Driven Circuit

作者: Xuefeng Wang Zhipeng Li

作者单位: Changshu Switchgear Mfg.Co.,Ltd.,Changshu, Jiangsu City, China

会议类型: 国际会议

会议名称: The 5nd Intrenational Conference on Reliability of Electrical Products and Electrical Contacts(第五届电工产品可靠性与电接触国际会议)

会议地点: 温州

会议语种:英文

页码: 195-198

在线出版日期: 2014-11-16（万方平台首次上网日期，不代表论文的发表时间）